ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,415, issued on April 8, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).
"System and method for testing memory device" was invented by Yaochang Chiu (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a system comprising a memory device and a processor. The memory device operates with a supply voltage having a first value. The processor is operatively coupled to the memory device and executes: generating a write command for writing a first datum to the memory device; generating a first read command for reading a second datum from the memory device and comparing the first datum and the second da...