US Patent Issued to NANYA TECHNOLOGY on April 8 for "Benchmark device on a semiconductor wafer with fuse element" (Taiwanese Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,642, issued on April 8, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Benchmark device on a semiconductor wafer with fuse element" was invented by Yi-Ju Chen (Taipei, Taiwan) and Jui-Hsiu Jao (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor wafer, a benchmark device embedded on a semiconductor wafer, and a method of operating a benchmark device embedded on a semiconductor wafer are provided. The semiconductor wafer includes a benchmark device disposed within a scribe line of the semiconductor wafer. The benchmark device includes a transistor, a diode, and a disconnecting switch electrically connected to...