US Patent Issued to Nanotronics Imaging on May 13 for "Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel" (New York, New Jersey, Florida Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,489, issued on May 13, was assigned to Nanotronics Imaging Inc. (Cuyahoga Falls, Ohio).

"Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel" was invented by Matthew C. Putman (Brooklyn, N.Y.), John B. Putman (Celebration, Fla.), Vadim Pinskiy (Wayne, N.J.) and Denis Sharoukhov (Brooklyn, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fluorescence microscopy inspection system includes light sources able to emit light that causes a specimen to fluoresce and light that does not cause a specimen to fluoresce. The emitted light is directed through one or more filters and objective channels towards a specimen. ...