US Patent Issued to Nanotronics Imaging on May 13 for "Deep learning model for auto-focusing microscope systems" (New York Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,301,990, issued on May 13, was assigned to Nanotronics Imaging Inc. (Cuyahoga Falls, Ohio).

"Deep learning model for auto-focusing microscope systems" was invented by Denis Sharoukhov (Brooklyn, N.Y.), Tonislav Ivanov (Brooklyn, N.Y.) and Jonathan Lee (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computing system receives, from an image sensor, at least two images of a specimen positioned on a specimen stage of a microscope system. The computing system provides the at least two images to an autofocus model for detecting at least one distances to a focal plane of the specimen. The computing system identifies, via the autofocus model, the at ...