US Patent Issued to Nanotronics Imaging on March 4 for "System and method for generating training data sets for specimen defect detection" (New York, Florida Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,243,293, issued on March 4, was assigned to Nanotronics Imaging Inc. (Cuyahoga Falls, Ohio).

"System and method for generating training data sets for specimen defect detection" was invented by Anuj Doshi (Long Island City, N.Y.), Jonathan Lee (Brooklyn, N.Y.) and John B. Putman (Celebration, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an an...