US Patent Issued to Nanotronics Imaging on Aug. 12 for "Artificial intelligence process control for assembly processes" (New York Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,317, issued on Aug. 12, was assigned to Nanotronics Imaging Inc. (Cuyahoga Falls, Ohio).

"Artificial intelligence process control for assembly processes" was invented by Jonathan Lee (Brooklyn, N.Y.) and Anuj Doshi (Long Island City, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A manufacturing system is disclosed herein. The manufacturing system includes a monitoring platform and an analytics platform. The monitoring platform is configured to capture data of an operator during assembly of an article of manufacture. The monitoring platform includes one or more cameras and one or more microphones. The analytics platform is in communication with...