US Patent Issued to NanoDX on June 3 for "Measurement systems and associated techniques for sensing electrical characteristics of a sensor" (New Mexico Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,795, issued on June 3, was assigned to NanoDX Inc. (Southborough, Mass.).

"Measurement systems and associated techniques for sensing electrical characteristics of a sensor" was invented by Sergey A. Dryga (Rio Rancho, N.M.) and Jonathon D. McMillan (Tijeras, N.M.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, devices, and methods of sensing electrical characteristics of a sensor are generally provided. Measurement devices described herein employ techniques for improved sensitivity when sensing electrical characteristics of a sensor. In some aspects, measurement devices described herein may be configured to reduce the impact of current noise ...