US Patent Issued to Nanjing University of Aeronautics and Astronautics on Oct. 28 for "Method for feature detection of complex defects based on multimodal data" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,289, issued on Oct. 28, was assigned to Nanjing University of Aeronautics and Astronautics (Nanjing, China).

"Method for feature detection of complex defects based on multimodal data" was invented by Jun Wang (Nanjing, China), Yuxiang Wu (Nanjing, China), Dawei Li (Nanjing, China) and Yuan Zhang (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure disclose a method for feature detection of complex defects based on multimodal data, including feature extraction of multimodal data, multimodal feature cross-guided learning, multimodal feature fusion, and defect classification and regression. Feature extraction networks f...