US Patent Issued to Nanjing University of Aeronautics and Astronautics on Nov. 18 for "Method for analyzing minor defect based on progressive segmentation network" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,547, issued on Nov. 18, was assigned to Nanjing University of Aeronautics and Astronautics (Nanjing, China).

"Method for analyzing minor defect based on progressive segmentation network" was invented by Jun Wang (Nanjing, China), Qifan Tu (Nanjing, China), Dawei Li (Nanjing, China) and Cheng Yi (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method for analyzing a minor defect based on a progressive segmentation network, including: acquiring an original image for a surface of a component, and cropping the original image into a plurality of patches; inputting each of the patches to a minor defect featu...