US Patent Issued to NANJING AGRICULTURAL UNIVERSITY on Jan. 13 for "Method for improving estimation of leaf area index in early growth stage of wheat based on red-edge band of sentinel-2 satellite image" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,900, issued on Jan. 13, was assigned to NANJING AGRICULTURAL UNIVERSITY (Nanjing, China).

"Method for improving estimation of leaf area index in early growth stage of wheat based on red-edge band of sentinel-2 satellite image" was invented by Xia Yao (Nanjing, China), Wei Li (Nanjing, China), Tao Cheng (Nanjing, China), Yan Zhu (Nanjing, China), Yongchao Tian (Nanjing, China), Weixing Cao (Nanjing, China), Dong Li (Nanjing, China), Hengbiao Zheng (Nanjing, China), Yu Zhang (Nanjing, China), Jifeng Ma (Nanjing, China), Xue Wang (Nanjing, China) and Caili Guo (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for improving estimat...