US Patent Issued to NAKANISHI on Oct. 28 for "Abnormality determination device and abnormality determination method for dental handpiece" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,453,618, issued on Oct. 28, was assigned to NAKANISHI INC. (Kanuma, Japan).

"Abnormality determination device and abnormality determination method for dental handpiece" was invented by Toyohei Nakajima (Kanuma, Japan) and Masahiro Higashi (Kanuma, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination device for a dental handpiece, the abnormality determination device including: an electrical current output unit configured to supply, to a drive motor attached to the dental handpiece, a test electrical current in a no-load state, the test electrical current being smaller than a no-load electrical current at a rotational speed o...