ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,388, issued on June 10, was assigned to Nabtesco Corp. (Tokyo).
"Abnormality detecting device" was invented by Hiroki Mori (Tokyo), Koji Nakamura (Tokyo), Kazuhiko Sakurai (Tokyo) and Masaki Harada (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detecting device relating to the present disclosure includes at least two first cover parts arranged next to each other in a circumferential direction; a plurality of electrode parts respectively supported by the first cover parts; a plurality of magnet parts provided inside of the first cover parts in the radial direction, where each magnet part is in contact with a corresponding one of...