ALEXANDRIA, Va., March 12 -- United States Patent no. 12,245,867, issued on March 11, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan).
"Measuring device" was invented by Jun Takagi (Nagaokakyo, Japan), Tomoki Takahashi (Nagaokakyo, Japan), Hiroaki Togashi (Nagaokakyo, Japan) and Kenji Tanaka (Nagaokakyo, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring device is provided with an improved contact property of a measuring surface of a sensor with respect to a surface of a target object. The measuring device includes a main body and a probe that has a head section at the distal end thereof and an arm section connecting the head section to the main body. The head section has a su...