ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,610, issued on July 8, was assigned to Murata Machinery Ltd. (Kyoto, Japan).
"Flow rate measurement device" was invented by Yasuhisa Ito (Ise, Japan) and Shinji Onishi (Ise, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A flow rate measurement device measures the flow rate of purge gas in a purge device configured to supply the purge gas to a container including a bottom lid configured to be attached to and detached from a container body. The flow rate measurement device includes: a base on which a flow-rate measurer is mounted; an engaged part provided in the base and configured to be engaged with the bottom lid; and a flow passage through wh...