ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,734, issued on Nov. 11, was assigned to MUNRO DESIGN & TECHNOLOGIES LLC (Ontario, N.Y.).
"Reflective interferometer systems and methods thereof" was invented by James F. Munro (Ontario, N.Y.) and Robert D. Niederriter (Albany, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An interferometer system for measuring the displacement of a location of a test surface includes a reflective beamsplitter having a through-hole through which light enters into and exits from a reference arm and having a second through-hole through which a portion of light from the measurement arm of the interferometer passes through the beamsplitter and is incident on a po...