US Patent Issued to MultiDimension Technology on Aug. 5 for "Magnetic probe-based current measurement device, and measurement method" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,402, issued on Aug. 5, was assigned to MultiDimension Technology Co. Ltd. (Zhangjiagang, China).

"Magnetic probe-based current measurement device, and measurement method" was invented by Pin Qu (Zhangjiagang, China), Songsheng Xue (Zhangjiagang, China), Huijuan Wang (Zhangjiagang, China) and Zongxin Liu (Zhangjiagang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic probe-based current measurement device and measurement method is disclosed. The device comprises a conductor for a current under test, a magnetic probe, a magnetic bias structure, and a programmable chip. A conductor has a first axis, a second axis, and a third axis. The co...