ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,328, issued on Dec. 23, was assigned to MSG Lithoglas GmbH (Dresden, Germany) and LYNRED (Palaiseau, France).
"Infrared detector forming method and associated infrared detector" was invented by David Bunel (Moirans, France), Ulli Hansen (Berlin) and Simon Maus (Berlin).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of forming an infrared detector includes defining an optical window in a cover substrate. Defining the optical window includes forming a multilayer interference filter or a periodic diffraction grating on an upper surface of the optical window and a periodic diffraction grating on the lower surface of the optical window. The metho...