ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,976, issued on Nov. 25, was assigned to MPI Corp. (Hsinchu Shien, Taiwan).
"Probe card and manufacturing method thereof" was invented by Chin-Yi Lin (Hsinchu County, Taiwan), Che-Wei Lin (Hsinchu County, Taiwan), Ting-Ju Wu (Hsinchu County, Taiwan) and Chien-Kai Hung (Hsinchu County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card and a manufacturing method of a probe card are provided. The probe card includes a probe head, first and second substrates, an insulating component, and an adhesive member. The second substrate is disposed between the probe head and the first substrate, and is disposed on the first substrate. The second ...