US Patent Issued to MPI on Aug. 19 for "Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,803, issued on Aug. 19, was assigned to MPI Corp. (Zhubei, Taiwan).

"Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system" was invented by Yang-Hung Cheng (Zhubei, Taiwan), Yu-Hao Chen (Zhubei, Taiwan), Jhin-Ying Lyu (Zhubei, Taiwan) and Hao Wei (Zhubei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card, a method for designing the probe card, a method for producing a tested semiconductor device, a method for testing an unpackaged semiconductor by the probe card, a device under test, and a probe syste...