ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,539, issued on Nov. 4, was assigned to MORPHO INC. (Chiyoda-ku, Japan) and TOKYO WELD Co. LTD. (Ota-ku, Japan).
"Analysis device and analysis method" was invented by Yoshihiko Yokoyama (Tokyo), Tsukasa Kato (Tokyo), Daiju Kikuchi (Tokyo), Satoshi Hirota (Tokyo) and Takuma Umeno (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device for visualizing an accuracy of a trained determination device includes an acquisition unit acquiring an image pair of a non-defective product image and a defective product image, an extraction unit extracting an image region of a defective part of the defective product, a generation unit generating a plur...