ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,472, issued on Dec. 23, was assigned to Montage Technology Co. Ltd. (Shanghai).
"Test circuit and test apparatus comprising the test circuit" was invented by Dongming Lou (Shanghai), Weidong Fan (Shanghai) and Zhongyuan Chang (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit includes a signal processor, a first resistor, a second resistor, a first switch, and a second switch. The signal processor is coupled to a first drive end, a second drive end, a first sensing end, and a second sensing end. The first resistor is coupled between the first drive end and the first sensing end. The second resistor is coupled between the second ...