US Patent Issued to Mochil on Oct. 7 for "Charged-particle beam microscope with differential vacuum pressures" (Washington Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,965, issued on Oct. 7, was assigned to Mochil Inc. (Seattle).

"Charged-particle beam microscope with differential vacuum pressures" was invented by Christopher Su-Yan Own (Seattle) and Matthew Francis Murfitt (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "A charged-particle beam microscope is provided for imaging a sample. The microscope has a housing to enclose a first volume at a first predefined vacuum pressure. A motorized stage is provided to hold and move a sample inside the first volume of the housing. A charged-particle beam module is provided in the housing, the charged-particle beam module including a chamber comprising one or more...