ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,462, issued on March 18, was assigned to MLS ACQ Inc. (East Windsor, Conn.).

"Monitoring gas impurities with total sulfur detection" was invented by Martin L. Spartz (Ellington, Conn.), Kelly Renee McPartland (West Hartford, Conn.), Anthony S. Bonanno (Ellington, Conn.) and Adam R. Klempner (Gardner, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for determining impurities in a beverage grade gas such as CO2 or N2 relies on FTIR gas analysis for measuring non-sulfur impurities as well as SO2. CO2% also can be determined. A multiplexer selects a sample gas from multiple gas samples. Conversion of reduced sulphur present in ...