ALEXANDRIA, Va., Sept. 17 -- United States Patent no. D1,093,181, issued on Sept. 16, was assigned to MITUTOYO Corp. (Kawasaki, Japan).
"Surface roughness measuring device" was invented by Sadaharu Arita (Hiroshima, Japan), Toshihiko Kajihara (Kure, Japan), Jun Odake (Tokyo) and Aoi Shimizu (Fujisawa, Japan).
The patent was filed on Oct. 20, 2021, under Application No. D/812,257.
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