US Patent Issued to Mitutoyo on Oct. 28 for "Metrology system with high speed position and orientation tracking mode" (Washington Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,158, issued on Oct. 28, was assigned to Mitutoyo Corp. (Kanagawa-ken, Japan).

"Metrology system with high speed position and orientation tracking mode" was invented by Nick Hartmann (Kirkland, Wash.) and Norman Laman (Kenmore, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A metrology system is provided for use with a movement system that moves an end tool. The metrology system includes a sensor configuration, a light beam source configuration and a processing portion. The light beam source configuration directs light beams to light beam sensors to indicate a position and orientation of the light beam source configuration. In a high speed oper...