US Patent Issued to MITUTOYO on March 4 for "Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses" (Japanese Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,737, issued on March 4, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses" was invented by Yuto Inoue (Kanagawa, Japan) and Masayuki Nara (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in p...