ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,635, issued on June 3, was assigned to Mitutoyo Corp. (Kanagawa-ken, Japan).
"Measuring probe with field generating coil configuration and temperature compensation" was invented by Christopher Richard Hamner (Kirkland, Wash.) and Scott Allen Harsila (Shoreline, Wash.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring probe for a coordinate measuring machine is provided. The measuring probe includes a stylus position detection portion, signal processing and control circuitry and a temperature dependent compensation portion. The stylus position detection portion includes a field generating coil configuration and a sensing coil configuration. Th...