US Patent Issued to MITUTOYO on Jan. 27 for "Machine vision system utilizing measurement marking device" (Washington Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,691, issued on Jan. 27, was assigned to MITUTOYO Corp. (Kanagawa-Ken, Japan).

"Machine vision system utilizing measurement marking device" was invented by Michael Nahum (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "A machine vision inspection system and method perform operations including: acquire a first image at a first image position, wherein the first image includes a first feature of a workpiece and a first measurement marking set of a measurement marking device (MMD); determine a first relative position of the first feature in the first image; move a stage supporting the workpiece to acquire a second image at a second image position,...