ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,466, issued on Jan. 13, was assigned to MITUTOYO Corp. (Kanagawa, Japan).
"Calibration jig" was invented by Ryosuke Tanaka (Oberndorf am Neckar, Germany), Hikaru Shigeno (Kanagawa, Japan) and Yuji Sadahira (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part...