ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,197, issued on Aug. 5, was assigned to MITUTOYO Corp. (Kanagawa, Japan).
"Abnormality determination apparatus, abnormality determination method, and abnormality determination system" was invented by Yo Terashita (Ibaraki, Japan), Yuuto Karasawa (Saitama, Japan), Akira Takada (Kanagawa, Japan), Shinji Hashimoto (Kanagawa, Japan) and Takuya Komada (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination apparatus includes a data acquisition part that acquires position data indicating a plurality of positions to be measured of a standard gage used in a coordinate measuring apparatus, in association with apparatus iden...