ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,069, issued on Aug. 12, was assigned to Mitutoyo Corp. (Kawasaki, Japan).
"Measurement apparatus and measurement method" was invented by Hiroki Ujihara (Ibaraki, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus including a laser apparatus that outputs a frequency-modulated laser beam with a plurality of modes of a main lobe, branch that splits the frequency-modulated laser beam into a reference light, a measurement light, and a monitor light, beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is reflected by radiating the measurement light onto an object to be measu...