ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,194, issued on April 29, was assigned to Mitutoyo Corp. (Kanagawa-ken, Japan).
"Motion mechanism for measuring probe" was invented by Isaiah Freerksen (Bothell, Wash.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring probe includes a stylus having one or more contact portions; a detection element configured to detect a movement of the stylus based on a contact made by the contact portions; a signal processing portion configured to process a signal from the detection element to output a measurement signal; and a stylus motion mechanism. The stylus motion mechanism includes a first motion portion configured to enable motion of the stylus from ...