US Patent Issued to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS on Jan. 13 for "Abnormality detection system, determination device, abnormality detection method, determination method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,319, issued on Jan. 13, was assigned to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS LTD. (Tokyo).

"Abnormality detection system, determination device, abnormality detection method, determination method, and program" was invented by Hidetaka Sato (Tokyo), Tomoyasu Osaki (Tokyo), Keiji Nagasaka (Tokyo) and Ryota Kojima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "This abnormality detection system comprises: a solenoid valve; a power supply which applies a voltage to a load terminal of the solenoid valve via a switch circuit and a diode; a drive circuit which drives the solenoid valve via the load terminal; a first detection unit which detects...