US Patent Issued to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS on Dec. 9 for "Abnormality diagnosis device and abnormality diagnosis method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,966, issued on Dec. 9, was assigned to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS LTD. (Tokyo).

"Abnormality diagnosis device and abnormality diagnosis method" was invented by Hirotaka Oka (Tokyo), Masumi Nomura (Tokyo), Tatsuo Ishiguro (Tokyo), Katsuaki Morita (Tokyo), Ryuji Ikeda (Tokyo), Kenichi Nagahara (Tokyo), Sota Kogawa (Tokyo), Noriyuki Matsukura (Tokyo), Satoshi Nikaido (Tokyo) and Yuki Nishizaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality diagnosis device includes an abnormality determination unit configured to determine whether or not there is an abnormality with respect to a state quantity acquired from equipmen...