US Patent Issued to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS on Dec. 30 for "Monitoring device and monitoring method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,886, issued on Dec. 30, was assigned to MITSUBISHI HEAVY INDUSTRIES THERMAL SYSTEMS LTD. (Tokyo).

"Monitoring device and monitoring method" was invented by Hirotaka Oka (Tokyo), Masumi Nomura (Tokyo), Tatsuo Ishiguro (Tokyo), Katsuaki Morita (Tokyo), Ryuji Ikeda (Tokyo), Kenichi Nagahara (Tokyo), Sota Kogawa (Tokyo), Noriyuki Matsukura (Tokyo), Satoshi Nikaido (Tokyo) and Yuki Nishizaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A monitoring device includes: an operation record acquisition unit configured to acquire operation records indicating a transition in a load factor or a load change factor with respect to operation time leading up...