US Patent Issued to MITSUBISHI HEAVY INDUSTRIES, TOKYO INSTITUTE OF TECHNOLOGY on June 10 for "Control device, inspection system, control method, and non-transitory computer-readable medium" (Japanese Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,325,122, issued on June 10, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo) and TOKYO INSTITUTE OF TECHNOLOGY (Tokyo).

"Control device, inspection system, control method, and non-transitory computer-readable medium" was invented by Yasutaka Fuke (Tokyo), Hirone Komatsu (Tokyo), Takashi Matsuzawa (Tokyo), Shin Asano (Tokyo), Kotaro Tadano (Tokyo), Koshiro Irie (Tokyo) and Chanvicharo Ly (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A control device for an inspection device including a long flexible robot that is formed by connecting a plurality of units and bendable at each unit with a desired curvature, and a posture actuator that adjus...