US Patent Issued to MITSUBISHI HEAVY INDUSTRIES, National Institute of Advanced Industrial Science and Technology on June 24 for "Laser light profile measuring device and laser light profile measuring method" (Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,160, issued on June 24, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo) and National Institute of Advanced Industrial Science and Technology (Tokyo).

"Laser light profile measuring device and laser light profile measuring method" was invented by Ryuichi Narita (Tokyo), Toshiya Watanabe (Tokyo), Misaki Fukuyama (Tokyo), Takeshi Kaneko (Tokyo) and Takayuki Numata (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A laser light profile measuring device of the present disclosure includes a reflection attenuation part reflecting and attenuating at least part of laser light incident from a first direction in a direction different from...