US Patent Issued to Mitsubishi Electric Research Laboratories on Sept. 30 for "Weak-signal fault identification of inverter-based microgrids" (Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,703, issued on Sept. 30, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.).

"Weak-signal fault identification of inverter-based microgrids" was invented by Hongbo Sun (Cambridge, Mass.), Imtiaj Khan (Cambridge, Mass.), Kyeong Jin Kim (Cambridge, Mass.) and Jianlin Guo (Cambridge, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a method and system for identifying an existence, location and type of a weak-signal fault in an islanded inverter-based microgrid. The weak-signal fault includes a high impedance fault, an inverter DC-side short-circuit fault, and an inverter tripping fault, and usually fails...