ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,498, issued on Sept. 30, was assigned to Mitsubishi Electric Corp. (Tokyo).
"Inspection device" was invented by Masafumi Takeda (Tokyo) and Tetsuhiro Fukao (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided here are: a measuring probe that is to be connected to a terminal pad of a measurement object; a measuring probe that is to be connected to a terminal pad of the measurement object, said terminal pad being electrically conductive with the terminal pad of the measurement object; and a signal source that is connected to both the measuring probe and the measuring probe and that can write or read a signal in or from the measurement objec...