ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,812, issued on Sept. 23, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).
"Malfunction analysis support program storage medium and malfunction analysis support apparatus" was invented by Takayuki Yamaoka (Tokyo), Motohiko Nakamura (Tokyo), Kenji Mine (Tokyo) and Hirokazu Kikuta (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A malfunction analysis support program causes a computer to perform a log data acquisition step, an action reproduction step, a three-dimensional data display step, a processing step being at least one of a program operation display step, a waveform display step, or a video display step, and a time synchronization step....