US Patent Issued to MITSUBISHI ELECTRIC on Oct. 14 for "Crack estimation device, failure diagnosis device, crack estimation method, and failure diagnosis method for rotating machine" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,738, issued on Oct. 14, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Crack estimation device, failure diagnosis device, crack estimation method, and failure diagnosis method for rotating machine" was invented by Norihiko Hana (Tokyo), Masao Akiyoshi (Tokyo) and Kenji Amaya (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a shape model setting circuitry for setting a shape model of a target structure, a crack candidate plane in the shape model, and an observation plane of the shape model, an estimation model generator for generating an estimation model obtained from a numerical analysis of a structural analysis model by seque...