ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,339, issued on Nov. 4, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).
"Phased array antenna calibration method and phased array antenna calibration system" was invented by Takashi Maruyama (Tokyo), Shigeo Udagawa (Tokyo), Mitsuru Kirita (Tokyo), Tai Tanaka (Tokyo) and Ryotaro Ohashi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for calibrating a phased array antenna is provided. The phased array antenna includes multiple transmission modules each including a phase shifter that changes a phase of a high frequency signal output from a signal source, an amplifier that amplifies an amplitude of the high frequency signal, and a transm...