ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,394, issued on May 27, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Deformation calculation device, deformation measurement device, and deformation calculation method" was invented by Shigetaka Saji (Tokyo) and Norihiko Hana (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The deformation calculation device includes: a deformation calculation unit which obtains a simply-calculated deformation of a measurement region by digital image correlation; a viewpoint change elimination unit which obtains a provisional deformation by subtracting, from the simply-calculated deformation, an apparent strain that is back-calculated on an assumption tha...