ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,601, issued on May 27, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).
"Crack estimation device and crack estimation method" was invented by Norihiko Hana (Tokyo), Masao Akiyoshi (Tokyo), Masaki Umeda (Tokyo) and Kenji Amaya (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A crack estimation device which accurately estimates a crack inside a structure is provided. The crack estimation device includes: a measurement unit which measures deformation of a measurement plane as a measurement plane deformation vector; a model generation unit which sets deformation of the measurement plane when a crack is generated in a crack generation plane, as a ...