ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,408, issued on March 25, was assigned to Mitsubishi Electric Corp. (Tokyo).
"Semiconductor laser inspection apparatus" was invented by Yohei Mikami (Tokyo) and Tetsuhiro Fukao (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor laser device (2) is placed on a first heating-cooling device (1). A probe holder (4) is attached on a second heating-cooling device (3), A measurement probe (8) is fixed to a distal end of the probe holder (4). A fine movement table (9) moves the second heating-cooling device (3) and the probe holder (4) so that a distal end of the measurement probe (8) contacts the semiconductor laser device (2). An inspec...