US Patent Issued to MITSUBISHI ELECTRIC on March 11 for "Abnormality cause estimation device, abnormality cause estimation method, and medium" (Japanese Inventor)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,247,752, issued on March 11, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Abnormality cause estimation device, abnormality cause estimation method, and medium" was invented by Yasuhiro Toyama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The abnormality cause device includes a sensor data acquiring unit for acquiring sensor data from a sensor installed in a target device, an abnormal tendency detecting unit for detecting an abnormal tendency of the sensor data by comparing the sensor data acquired by the sensor data acquiring unit with a normal model showing a normal value range of the sensor data, and an abnormality cause estimating uni...