US Patent Issued to Mitsubishi Electric on June 3 for "Inspection device, inspection method, and recording medium for inspecting an inspection target with machine learning" (Japanese Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,079, issued on June 3, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Inspection device, inspection method, and recording medium for inspecting an inspection target with machine learning" was invented by Yuichi Ikeda (Tokyo), Kazuyuki Miyazawa (Tokyo), Akira Minezawa (Tokyo) and Yukihiro Toku (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A position detector applies an image to be inspected to a position detection model generated by machine learning using image information of a training image to calculate a score for a portion of an image to be inspected. The position detector specifies a portion of the image where the calculated score is...