US Patent Issued to MITSUBISHI ELECTRIC on Dec. 16 for "Failure sign determination device, onboard device, and failure sign determination method" (Japanese Inventor)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,496,907, issued on Dec. 16, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Failure sign determination device, onboard device, and failure sign determination method" was invented by Toru Hirata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A failure sign determining device includes an acquirer to acquire pieces of sensor data based on respective values measured by multiple sensors, an FFT processor to execute fast Fourier transform on each of the pieces of sensor data and thereby generate a piece of frequency spectrum data, and a determiner to determine the existence of a failure sign on the basis of comparison between the piece of frequency...