US Patent Issued to MITSUBISHI ELECTRIC, MITSUBISHI ELECTRIC RESEARCH LABORATORIES on June 24 for "Abnormality diagnosis device and abnormality diagnosis method" (Japanese, American Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,341,450, issued on June 24, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo) and MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC. (Cambridge, Mass.).

"Abnormality diagnosis device and abnormality diagnosis method" was invented by Hiroshi Inoue (Tokyo), Bingnan Wang (Cambridge, Mass.) and Lei Zhou (Cambridge, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality diagnosis device includes: a first interface to obtain a value of a driving current for driving a motor; and a processor to access a database including calculation data to be used to calculate a degree of abnormality of the motor, wherein the processor extracts a feature quantity for...