US Patent Issued to MiTeGen on July 22 for "Sample supports and sample cooling systems for cryo-electron microscopy" (New York Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,509, issued on July 22, was assigned to MiTeGen LLC (Ithac, N.Y.).

"Sample supports and sample cooling systems for cryo-electron microscopy" was invented by David Closs (Freeville, N.Y.), Benjamin Apker (Barton, N.Y.) and Robert E. Thorne (Ithaca, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention is directed to a sample support design and sample cooling devices for single-particle cryo-electron microscopy that simplify sample preparation and handling, dramatically reduce errors and improve outcome reproducibility, and dramatically reduce overall costs. A system includes a grid based sample support system, grid handling tools, grid bl...